Examination of distribution regularities in static RAM microcircuit cells in case of using them as a physically unclonable function in a mutual authentication module

Abstract

The item offers a view on the outcomes of a study focusing on static memory microcircuits seen as a physically unclonable function for devices with mutual authentication. An experimental units has been developed, as well as a series of measurements has been performed in static memory microcircuit cells at the point of initialization; an analysis has been performed for values distribution in cells for the measurements series. Values have been calculated for auto-correlational functions at various sets of values. An attempt has been made to explain the observed regularities and define requirements for static RAM microcircuits when using that as a physically unclonable function