Репозиторий научных и учебно-методических публикаций
ФГАОУ ВО «Северо-Кавказский федеральный университет»
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https://dspace.ncfu.ru/handle/20.500.12258/538| Title: | Study of the field emission graphene/SiC nanostructures using scanning probe microscopy |
| Authors: | Volkov, E. Y. Волков, Е. Ю. |
| Keywords: | Current voltage characteristics;Field emission;Graphene;Hydrophobicity;Nanostructures;Scanning probe microscopy |
| Issue Date: | 2017 |
| Publisher: | Institute of Physics Publishing |
| Citation: | Jityaev, I.L., Svetlichnyi, A.M., Kolomiytsev, A.S., Volkov, Y.E., Polyakova, V.V., Ageev, O.A. Study of the field emission graphene/SiC nanostructures using scanning probe microscopy // IOP Conference Series: Materials Science and Engineering. - 2017. - Volume 256. - Issue 1. - статья № 012021. |
| Series/Report no.: | IOP Conference Series: Materials Science and Engineering |
| Abstract: | We investigated the topology and electrical characteristics of the field emission graphene/SiC nanostructures using scanning probe microscopy. The effect of design of graphene/SiC nanostructures on field emission properties was estimated. The current-voltage characteristics were measured at different rounding-off radii of the emitting top and the interelectrode distances |
| URI: | https://www.scopus.com/record/display.uri?eid=2-s2.0-85034428005&origin=resultslist&sort=plf-f&src=s&nlo=1&nlr=20&nls=afprfnm-t&affilName=nort*+caucas*+fed*+univ*&sid=d5d8a0d301244722be90437f5b553481&sot=afnl&sdt=cl&cluster=scopubyr%2c%222017%22%2ct&sl=53&s=%28AF-ID%28%22North+Caucasus+Federal+University%22+60070541%29%29&relpos=18&citeCnt=0&searchTerm= https://dspace.ncfu.ru:443/handle/20.500.12258/538 |
| Appears in Collections: | Статьи, проиндексированные в SCOPUS, WOS |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| scopusresults (82).pdf Restricted Access | 62.58 kB | Adobe PDF | View/Open | |
| WoS 50 .pdf Restricted Access | 554.87 kB | Adobe PDF | View/Open |
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