Please use this identifier to cite or link to this item: https://dspace.ncfu.ru/handle/20.500.12258/5459
Title: Modeling of structural defects in silicon carbide
Authors: Sokolenko, E. V.
Соколенко, Е. В.
Slyusarev, G. V.
Слюсарев, Г. В.
Keywords: Electron density;Impurity defects;Local levels;Nanoclusters;Vacancies;Silicon carbide
Issue Date: 2019
Publisher: Pleiades Publishing
Citation: Sokolenko, E.V., Slyusarev, G.V. Modeling of Structural Defects in Silicon Carbide // Inorganic Materials. - 2019. - Volume 55. - Issue 1. - Pages 19-31
Series/Report no.: Inorganic Materials
Abstract: This paper reports DFT calculations of the electron density in pure and imperfect silicon carbide clusters. The local levels produced in the band gap by doping are shown to be determined predominantly by intrinsic states of the silicon and carbon
URI: https://www.scopus.com/record/display.uri?eid=2-s2.0-85065572605&origin=resultslist&sort=plf-f&src=s&st1=Modeling+of+Structural+Defects+in+Silicon+Carbide&st2=&sid=2baddd47ab8d40ac26e088b8dca66c22&sot=b&sdt=b&sl=64&s=TITLE-ABS-KEY%28Modeling+of+Structural+Defects+in+Silicon+Carbide%29&relpos=0&citeCnt=0&searchTerm=
http://hdl.handle.net/20.500.12258/5459
Appears in Collections:Статьи, проиндексированные в SCOPUS, WOS

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